![[IEEE 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Nis, Serbia (2019.9.16-2019.9.18)] 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Modelling of ΔV
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[IEEE 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Nis, Serbia (2019.9.16-2019.9.18)] 2019 IEEE 31st International Conference on Microelectronics (MIEL) - Modelling of ΔV
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in NBT Stressed P-Channel Power VDMOSFETsMitrovic, N.; Dankovic, D.; Prijic, Z.; Stojadinovic, N. · 2019