Effects of Cryogenic Sample Analysis on Molecular Depth Profiles with TOF-Secondary Ion Mass Spectrometry
- 期刊名称Analytical Chemistry
- 作者Piwowar, Alan M.; Fletcher, John S.; Kordys, Jeanette; Lockyer, Nicholas P.; Winograd, Nicholas; Vickerman, John C.
- 卷第82卷
- 期第19期
- 印刷ISSN0003-2700
- 电子ISSN1520-6882
- 文件大小1729.51KB
- 发表时间2010-10
- DOI10.1021/ac101746h
- 页码8291-8299
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IndexApplied Surface Science · 2001
IndexApplied Surface Science · 2001
PrefaceNakayama, Katsuya; Yoshimori, Akio; Murata, Yoshitada · Applied Surface Science · 2001
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Editorial BoardApplied Surface Science · 2012
Editorial BoardApplied Surface Science · 2012
Editorial BoardApplied Surface Science · 2012