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[IEEE 2010 International Conference on Microelectronics (ICM) - Cairo, Egypt (2010.12.19-2010.12.22)] 2010 International Conference on Microelectronics - Physical parametric analysis of 16nm n-channel Carbon-Nanotube transistors for manufacturability

[IEEE 2010 International Conference on Microelectronics (ICM) - Cairo, Egypt (2010.12.19-2010.12.22)] 2010 International Conference on Microelectronics - Physical parametric analysis of 16nm n-channel Carbon-Nanotube transistors for manufacturability

Yanan Sun, ; Kursun, Volkan

作者Yanan Sun, ; Kursun, Volkan
文件大小348.42KB
发表时间2010
DOI10.1109/icm.2010.5696141
页码28-31

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