[IEEE 2010 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - San Francisco, CA, USA (2010.06.13-2010.06.18)] 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - High-resolution modeling of moving and deforming objects using sparse geometric and dense photometric measurements
- 作者Xu, Yi; Aliaga, Daniel G.
- 文件大小2461.99KB
- 发表时间2010
- DOI10.1109/cvpr.2010.5539825
- 页码1237-1244
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