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[IEEE 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - San Diego, CA, USA (2017.5.21-2017.5.24)] 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - Keynotes ASYNC 20172017
[IEEE 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - San Diego, CA, USA (2017.5.21-2017.5.24)] 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - [Copyright notice]2017
[IEEE 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - San Diego, CA (2017.5.21-2017.5.24)] 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - Table of contents2017
[IEEE 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - San Diego, CA, USA (2017.5.21-2017.5.24)] 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - Conference Organization2017
[IEEE 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - San Diego, CA, USA (2017.5.21-2017.5.24)] 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - Author index2017
[IEEE 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - San Diego, CA, USA (2017.5.21-2017.5.24)] 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - [Front cover]2017
[IEEE 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - San Diego, CA, USA (2017.5.21-2017.5.24)] 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - [Title page i]2017
[IEEE 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - San Diego, CA, USA (2017.5.21-2017.5.24)] 2017 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) - [Title page iii]2017
[IEEE 2018 IEEE 19th Latin-American Test Symposium (LATS) - Sao Paulo, Brazil (2018.3.12-2018.3.14)] 2018 IEEE 19th Latin-American Test Symposium (LATS) - A fault tolerant dynamically scheduled processor with partial permanent fault handlingMuhlbauer, Felix; Schroder, Lukas; Scholzel, Mario · 2018
[IEEE 2017 18th IEEE Latin American Test Symposium (LATS) - Bogota, Colombia (2017.3.13-2017.3.15)] 2017 18th IEEE Latin American Test Symposium (LATS) - Handling manufacturing and aging faults with software-based techniques in tiny embedded systemsMuhlbauer, Felix; Schroder, Lukas; Skoncej, Patryk; Scholzel, Mario · 2017
[IEEE 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Sant Feliu de Guixols, Spain (2016.7.4-2016.7.6)] 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Feasibility of software-based repair for program memoriesSkoncej, Patryk; Muhlbauer, Felix; Kubicek, Felix; Schroder, Lukas; Scholzel, Mario · 2016
[IEEE 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Dresden, Germany (2017.4.19-2017.4.21)] 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - On hardware-based fault-handling in dynamically scheduled processorsMuhlbauer, Felix; Schroder, Lukas; Scholzel, Mario · 2017