![[IEEE 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Raleigh, NC, USA (2005.11.6-2005.11.6)] 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Local 3D map building and error analysis based on stereo vision]()
[IEEE 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Raleigh, NC, USA (2005.11.6-2005.11.6)] 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Local 3D map building and error analysis based on stereo visionHuahua Chen, ; Zezhong Xu, · 2005