Robust MT Tracking Based on M-Estimation and Interacting Multiple Model Algorithm
- 期刊名称IEEE Transactions on Signal Processing
- 作者Hammes, Ulrich; Zoubir, Abdelhak M
- 卷第59卷
- 期第7期
- 印刷ISSN1053-587X
- 电子ISSN1941-0476
- 文件大小930.22KB
- 发表时间2011-07
- DOI10.1109/tsp.2011.2138702
- 页码3398-3409
[IEEE 43rd ARFTG Conference Digest - San Diego, CA, USA (1994.05.27-1994.05.27)] 43rd ARFTG Conference Digest - ARFTG Executive Committee Members1994
[IEEE 43rd ARFTG Conference Digest - San Diego, CA, USA (1994.05.27-1994.05.27)] 43rd ARFTG Conference Digest - An Air Coplanar Wafer ProbeGodshalk, Edward M.; Burr, Jeremy; Williams, Jeff · 1994
[IEEE 43rd ARFTG Conference Digest - San Diego, CA, USA (1994.05.27-1994.05.27)] 43rd ARFTG Conference Digest - Data Processing For Q Factor MeasurementKajfez, Darko · 1994
[IEEE 43rd ARFTG Conference Digest - San Diego, CA, USA (1994.05.27-1994.05.27)] 43rd ARFTG Conference Digest - Determining Uncertainty in Antenna Array MeasurementsCha, James; Koert, Peter; Elliot, Paul; Groff, Richard; Collins, Thomas · 1994
[IEEE 43rd ARFTG Conference Digest - San Diego, CA, USA (1994.05.27-1994.05.27)] 43rd ARFTG Conference Digest - High Accuracy Signal/Noise Measurement of Microwave Power AmplifiersHillenberg, Steve; MacMullen, Alexander · 1994
[IEEE 43rd ARFTG Conference Digest - San Diego, CA, USA (1994.05.27-1994.05.27)] 43rd ARFTG Conference Digest - Accuracy of Broadband On-Wafer Load Pull MeasurementsDeHaan, Michael R.; Reese, Elias · 1994
[IEEE 43rd ARFTG Conference Digest - San Diego, CA, USA (1994.05.27-1994.05.27)] 43rd ARFTG Conference Digest - Automated High-Power RF Microwave Tube Test StandYoung, Andrew; Rees, Daniel E. · 1994
[IEEE 43rd ARFTG Conference Digest - San Diego, CA, USA (1994.05.27-1994.05.27)] 43rd ARFTG Conference Digest - Network Analyzer Calibration for Cryogenic On-Wafer MeasurementsHietala, Vincent M.; Housel, Mark S.; Caldwell, Robert B. · 1994