![[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Using Oxide-Trap Charge-Pumping method in radiation reliability analysis of short lightly doped drain transistor]()
[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Using Oxide-Trap Charge-Pumping method in radiation reliability analysis of short lightly doped drain transistorDjezzar, Boualem; Tahi, Hakim · 2009