![[IEEE 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC) - San Jose, CA, USA (2016.5.23-2016.5.26)] 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC) - Is electron transport in nanocrystalline Cu interconnects surface dominated or grain boundary dominated?]()
[IEEE 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC) - San Jose, CA, USA (2016.5.23-2016.5.26)] 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC) - Is electron transport in nanocrystalline Cu interconnects surface dominated or grain boundary dominated?Hegde, Ganesh; Bowen, R. Chris; Rodder, Mark S. · 2016