TCAD for reliability
- 作者P. Pfäffli; P. Tikhomirov; X. Xu; I. Avci; Y.-S. Oh; P. Balasingam; S. Krishnamoorthy; T. Ma
- 卷第52卷
- 文件大小1949.73KB
- 发表时间2012
- DOI10.1016/j.microrel.2012.06.025
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