海量图书期刊资源,随时随地畅享阅读乐趣
Positive charge trapping in thin gate oxides of MOS capacitors during constant current and voltage fowler-nordheim stressPiyas Samanta; C. K. Sarkar · 1995
Correlation between the gate bias dependence of the probability of anode hole injection and breakdown in thin silicon dioxide filmsSamanta, Piyas; Sarkar, C. K. · Applied Physics Letters · 2000
Electro-rheologyBlock, H; Kelly, J P · Journal of Physics D: Applied Physics · 1988
Semiconductor nanowiresLu, Wei; Lieber, Charles M · Journal of Physics D: Applied Physics · 2006
Nanoassembled model catalystsHeiz, Ueli; Schneider, Wolf-Dieter · Journal of Physics D: Applied Physics · 2000
Mechanisms for exchange biasStamps, R L · Journal of Physics D: Applied Physics · 2000
Thermal plasma waste treatmentHeberlein, Joachim; Murphy, Anthony B · Journal of Physics D: Applied Physics · 2008
Surface enhanced fluorescenceFort, Emmanuel; Grésillon, Samuel · Journal of Physics D: Applied Physics · 2008
Nanocomposite dielectrics—properties and implicationsNelson, J K; Hu, Y · Journal of Physics D: Applied Physics · 2005
Memristor-based neural networksThomas, Andy · Journal of Physics D: Applied Physics · 2013