SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Optical correlation diagnostics of rough surfaces: statistical and fractal approach
- 作者Angelsky, Oleg V.; Maksimyak, Peter P.; Burcovets, Dimitry N.; Grigiraschuk, I. M.; Angelsky, Oleg V.
- 印刷ISSN0277-786X
- 文件大小1226.78KB
- 发表时间2012
- DOI10.1117/12.559766
- 页码114-130
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[IEEE 2015 19th International Symposium on VLSI Design and Test (VDAT) - Ahmedabad, India (2015.6.26-2015.6.29)] 2015 19th International Symposium on VLSI Design and Test - Keyword index2015
[IEEE 2015 19th International Symposium on VLSI Design and Test (VDAT) - Ahmedabad, India (2015.6.26-2015.6.29)] 2015 19th International Symposium on VLSI Design and Test - Cover page2015
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