![Experimental Assessment of Electrons and Holes in Erase Transient of TANOS and TANVaS Memories]()
Experimental Assessment of Electrons and Holes in Erase Transient of TANOS and TANVaS MemoriesSuhane, Amit; Arreghini, Antonio; Van den bosch, Geert; Vandelli, Luca; Padovani, Andrea; Breuil, Laurent; Larcher, Luca; De Meyer, Kristin; Van Houdt, Jan · IEEE Electron Device Letters · 2010