![[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Dynamic arbitrary jitter injection method for ≫6.5Gb/s SerDes testing]()
[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Dynamic arbitrary jitter injection method for ≫6.5Gb/s SerDes testingFujibe, T.; Suda, M.; Yamamoto, K.; Nagata, Y.; Fujita, K.; Watanabe, D.; Okayasu, T. · 2009