AIP Conference Proceedings [AIP PROCEEDING OF INTERNATIONAL CONFERENCE ON RECENT TRENDS IN APPLIED PHYSICS AND MATERIAL SCIENCE: RAM 2013 - Bikaner, Rajasthan, India (1–2 February 2013)] - Determination of refractive index and thickness of thin-film from reflectivity spectrum using genetic algorithm
Patel, Sanjaykumar J.; Kheraj, Vipul
- 作者Patel, Sanjaykumar J.; Kheraj, Vipul
- 印刷ISSN0094-243X
- 文件大小231.64KB
- 发表时间2013
- DOI10.1063/1.4810324
- 页码509-510