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[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Testing PUF-based secure key storage circuits

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Testing PUF-based secure key storage circuits

Cortez, Mafalda; Roelofs, Gijs; Hamdioui, Said; Natale, Giorgio di

作者Cortez, Mafalda; Roelofs, Gijs; Hamdioui, Said; Natale, Giorgio di
文件大小385.09KB
发表时间2014
DOI10.7873/DATE.2014.207
页码1-6

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