Book List
- 期刊名称Natural Areas Journal
- 卷第34卷
- 期第1期
- 印刷ISSN0885-8608
- 电子ISSN2162-4399
- 文件大小104.52KB
- 发表时间2014-01
- DOI10.3375/043.034.0114
- 页码126-127
[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (2005.04.21-2005.04.21)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - 2005 IEEE International Reliability Physics Symposium Proceedings 43nd Annual2005
[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (2005.04.21-2005.04.21)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - 2005 IEEE International Reliability Physics Symposium. Proceedings 43rd Annual (IEEE Cat. No. 05CH37616)2005
[IEEE 2004 IEEE International Reliability Physics Symposium. Proceedings - Phoenix, AZ, USA (2004.04.29-2004.04.29)] 2004 IEEE International Reliability Physics Symposium Proceedings RELPHY-04 - 2005 International Reliability Physics Symposium April 17-21,20052004
[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (2005.04.21-2005.04.21)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Biographies2005
[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (2005.04.21-2005.04.21)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Preface2005
[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (2005.04.21-2005.04.21)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Copyright2005
[IEEE 2005 IEEE International Reliability Physics Symposium. Proceedings 43rd Annual - San Jose, CA, USA (2005.04.17-2005.04.21)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Blank page2005
[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (2005.04.21-2005.04.21)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - 2005 IRPS Tutorial program2005
[IEEE Oper. Center 2003 International Semiconductor Conference. CAS 2003 - Sinaia, Romania (28 Sept.-2 Oct. 2003)] 2003 International Semiconductor Conference. CAS 2003 Proceedings (IEEE Cat. No.03TH8676) - Electrical characterisation of high voltage MOSFETs using MESDRIFTAnghel, C.; Hefyene, N.; Vermandel, M.; Bakeroot, B.; Doutreloigne, J.; Gillon, R.; Ionescu, A.M. · 2003
[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - New method for temperature-dependent thermal resistance and capacitance accurate extraction in high-voltage DMOS transistorsAnghel, C.; Hefyene, N.; Gillon, R.; Tack, M.; Declercq, M.J.; Ionescu, A.M. · 2003