![[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Testing PUF-based secure key storage circuits]()
[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Testing PUF-based secure key storage circuitsCortez, Mafalda; Roelofs, Gijs; Hamdioui, Said; Natale, Giorgio di · 2014