![[IEEE 2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) - Riga, Latvia (2017.11.24-2017.11.25)] 2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) - Comparison of LC-VCO and LC-DCO parameters in 65 nm CMOS technology]()
[IEEE 2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) - Riga, Latvia (2017.11.24-2017.11.25)] 2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) - Comparison of LC-VCO and LC-DCO parameters in 65 nm CMOS technologyMacaitis, V.; Navickas, R. · 2017