[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - PUF modeling attacks: An introduction and overviewRuhrmair, Ulrich; Solter, Jan · 2014

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - PUF modeling attacks: An introduction and overviewRuhrmair, Ulrich; Solter, Jan · 2014

[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - Ultra-Low Power: An EDA ChallengeGrimm, Christoph; Moreno, Javier; Pan, Xiao · 2013

[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - An Efficient Wirelength Model for Analytical PlacementRay, B.N.B.; Balachandran, Shankar · 2013

[IEEE Conference Publications Design, Automation and Test in Europe - Grenoble, France (2015.03.9-2015.03.13)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 - An Approximate Voting Scheme for Reliable ComputingChen, Ke; Lombardi, Fabrizio; Han, Jie · 2015

[IEEE Conference Publications Design, Automation and Test in Europe - Grenoble, France (2015.03.9-2015.03.13)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 - Bordersearch: An Adaptive Identification of Failure RegionsDobler, Markus; Harrant, Manuel; Rafaila, Monica; Pelz, Georg; Rosenstiel, Wolfgang; Bogdan, Martin · 2015

[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - An Extremely Compact JPEG Encoder for Adaptive Embedded SystemsSchneider, Josef; Parameswaran, Sri · 2013

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - An embedded offset and gain instrument for OpAmp IPsWan, Jinbo; Kerkhoff, Hans G. · 2014

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - A wear-leveling-aware dynamic stack for PCM memory in embedded systemsLi, Qingan; He, Yanxiang; Chen, Yong; Xue, Chun Jason; Jiang, Nan; Xu, Chao · 2014