[IEEE 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Singapore, Singapore (2015.6.1-2015.6.4)] 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Consistent simulation of dynamic carrier trap/detrap effects on circuit performance
Miura-Mattausch, M.; Tanimoto, Y.; Okada, Y.; Matsuura, K.; Kikuchihara, H.; Mattausch, H. J.
- 作者Miura-Mattausch, M.; Tanimoto, Y.; Okada, Y.; Matsuura, K.; Kikuchihara, H.; Mattausch, H. J.
- 文件大小699.14KB
- 发表时间2015
- DOI10.1109/edssc.2015.7285151
- 页码463-466