Thin Film and Multilayer Scintillators for Low Voltage Backscattered Electron Imaging in the Scanning Electron Microscope
- 期刊名称Microscopy and Microanalysis
- 作者Barbi, NC; Tzolov, MB; Healy, OE; Mott, RB; McDonald, WM
- 卷第21卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小317.97KB
- 发表时间2015-08
- DOI10.1017/s1431927615004973
- 页码835-836
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