myCS House
- 期刊名称IT Professional
- 卷第18卷
- 期第5期
- 印刷ISSN1520-9202
- 文件大小1815.81KB
- 发表时间2016-9
- DOI10.1109/mitp.2016.88
- 页码33-33
Test Technology TC NewsletterTheocharides, Theo · IEEE Design & Test of Computers · 2012
Test Technology TC NewsletterTheocharides, Theo · IEEE Design & Test · 2013
Test Technology TC NewsletterTheocharides, Theo · IEEE Design & Test · 2013
Test Technology TC NewsletterTheocharides, Theo · IEEE Design & Test · 2014
Test Technology TC NewsletterTheocharides, Theo · IEEE Design & Test · 2015
Test Technology TC NewsletterTheocharides, Theo · IEEE Design & Test · 2015
Test Technology TC NewsletterTheocharides, Theo · IEEE Design & Test · 2016
Test Technology TC NewsletterTheocharides, Theo · IEEE Design & Test · 2015
Digitally intensive wireless transceiversStaszewski, Robert Bogdan · IEEE Design & Test of Computers · 2012
Test Challenges for 3D Integrated CircuitsLee, Hsien-Hsin; Chakrabarty, Krishnendu · IEEE Design & Test · 2013
Adaptive Alternate Analog TestStratigopoulos, Haralampos-G.; Mir, Salvador · IEEE Design & Test of Computers · 2012
The Olympus synthesis systemDe Micheli, G.; Ku, D.; Mailhot, F.; Truong, T. · IEEE Design & Test of Computers · 1990
Clock system designWagner, K.D. · IEEE Design & Test of Computers · 1988
Alpha 21164 testability strategyBhavsar, D.K.; Edmondson, J.H. · IEEE Design & Test of Computers · 1997
Automatic generation of parallel CRC circuitsSprachmann, M. · IEEE Design & Test of Computers · 2001
Automated BIST for sequential logic synthesisStroud, C.E. · IEEE Design & Test of Computers · 1988