![[IEEE 2017 IEEE 17th International Conference on Communication Technology (ICCT) - Chengdu, China (2017.10.27-2017.10.30)] 2017 IEEE 17th International Conference on Communication Technology (ICCT) - Research on hot carrier reliability of n-MOSFET in deep submicron technology]()
[IEEE 2017 IEEE 17th International Conference on Communication Technology (ICCT) - Chengdu, China (2017.10.27-2017.10.30)] 2017 IEEE 17th International Conference on Communication Technology (ICCT) - Research on hot carrier reliability of n-MOSFET in deep submicron technologyShen, Jingyu; Zhang, Ming; Tan, Can; Fan, Xue; Li, Wei · 2017