Ultrafast Three-Dimensional X-ray Imaging of Deformation Modes in ZnO Nanocrystals

Cherukara, Mathew J.; Sasikumar, Kiran; Cha, Wonsuk; Narayanan, Badri; Leake, Steven J.; Dufresne, Eric M.; Peterka, Tom; McNulty, Ian; Wen, Haidan; Sankaranarayanan, Subramanian K. R. S.; Harder, Ross J.

期刊名称Nano Letters
作者Cherukara, Mathew J.; Sasikumar, Kiran; Cha, Wonsuk; Narayanan, Badri; Leake, Steven J.; Dufresne, Eric M.; Peterka, Tom; McNulty, Ian; Wen, Haidan; Sankaranarayanan, Subramanian K. R. S.; Harder, Ross J.
卷第17卷
期第2期
印刷ISSN1530-6984
电子ISSN1530-6992
文件大小1324.67KB
发表时间2017-02-08
DOI10.1021/acs.nanolett.6b04652
页码1102-1108

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Ultrafast Three-Dimensional X-ray Imaging of Deformation Modes in ZnO Nanocrystals