Burn Shock and Resuscitation
- 期刊名称Journal of Burn Care & Research
- 作者Serio-Melvin, Maria L.; Salinas, José; Chung, Kevin K.; Collins, Clayton; Graybill, John C.; Harrington, David T.; Herndon, David N.; Greenhalgh, David G.; Kramer, George C.; Lintner, Alicia; Mosier, Michael J.; Nagpal, Ashish; Cancio, Leopoldo C.
- 卷第38卷
- 期第1期
- 印刷ISSN1559-047X
- 文件大小284.00KB
- 发表时间2017
- DOI10.1097/BCR.0000000000000417
[IEEE 2018 31st IEEE International System-on-Chip Conference (SOCC) - Arlington, VA (2018.9.4-2018.9.7)] 2018 31st IEEE International System-on-Chip Conference (SOCC) - 0.4V Reconfigurable Near-Threshold TCAM in 28nm High-k Metal-Gate CMOS ProcessChan, Yun-Sheng; Huang, Po-Tsang; Wu, Shang-Lin; Lung, Sheng-Chi; Wang, Wei-Chang; Hwang, Wei; Chuang, Ching-Te · 2018
[IEEE 2018 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) - Västerås, Sweden (2018.4.9-2018.4.13)] 2018 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) - Design of High Confidence Embedded Software Hardware-in-Loop Simulation Test Platform Based on Hierarchical ModelDeng, Fei; Gao, Feng · 2018
[IEEE 2018 IEEE 11th International Conference on Software Testing, Verification and Validation (ICST) - Västerås, Sweden (2018.4.9-2018.4.13)] 2018 IEEE 11th International Conference on Software Testing, Verification and Validation (ICST) - Invasive Software Testing: Mutating Target Programs to Diversify Test Exploration for High Test CoverageKim, Yunho; Hong, Shin; Ko, Bongseok; Phan, Duy Loc; Kim, Moonzoo · 2018
[IEEE 2018 International Conference on Circuits and Systems in Digital Enterprise Technology (ICCSDET) - Kottayam, India (2018.12.21-2018.12.22)] 2018 International Conference on Circuits and Systems in Digital Enterprise Technology (ICCSDET) - High-Quality Image Scaling Using V-ModelSudhakaran, Anju; Manuel, Manju · 2018
[IEEE 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Qingdao, China (2018.10.31-2018.11.3)] 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Wide SOA and High Reliability 60-100 V LDMOS Transistors with Low Switching Loss and Low Specific On-ResistanceMatsuda, Jun-ichi; Kuwana, Anna; Kojima, Jun-ya; Tsukiji, Nobukazu; Kobayashi, Haruo · 2018
[IEEE 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Qingdao, China (2018.10.31-2018.11.3)] 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - A 12 V Low-Ripple and High-Efficiency Charge Pump with Continuous Regulation Scheme for 3D NAND Flash MemoriesWang, Qianqian; Liu, Fei; Huang, Cece; Fu, Liyin; Huo, Zongliang · 2018
[IEEE 2018 16th IEEE International New Circuits and Systems Conference (NEWCAS) - Montréal, QC, Canada (2018.6.24-2018.6.27)] 2018 16th IEEE International New Circuits and Systems Conference (NEWCAS) - A 0.5V 46.2ppm°C CMOS Voltage Reference Based on Compensated ΔV<inf>TH</inf> with Wide Temperature Range and High PSRRHe, Linjun; Zhan, Chenchang; Nan, Yang; Zhang, Ning; Wang, Lidan; Li, Guofeng · 2018
[IEEE 2018 International Conference on Advances in Computing, Communications and Informatics (ICACCI) - Bangalore, India (2018.9.19-2018.9.22)] 2018 International Conference on Advances in Computing, Communications and Informatics (ICACCI) - High Performance Square Spiral Inductor for 65 nm CMOS V-band Low Noise AmplifierSubramani, Koushik Murali; Maganti, Gopi Tharun; Gowri Jegatheesh, M; Krishnaa, Y Alokh; Balamurugan, Karthigha · 2018