Integrated Full Duplex Radios
- 期刊名称IEEE Communications Magazine
- 作者Zhou, Jin; Reiskarimian, Negar; Diakonikolas, Jelena; Dinc, Tolga; Chen, Tingjun; Zussman, Gil; Krishnaswamy, Harish
- 卷第55卷
- 期第4期
- 印刷ISSN0163-6804
- 文件大小2672.03KB
- 发表时间2017-4
- DOI10.1109/MCOM.2017.1600583
- 页码142-151
Electrical and Ultraviolet-A Detection Properties of E-Beam Evaporated n-TiO2 Capped p-Si Nanowires Heterojunction PhotodiodesRawat, Gopal; Somvanshi, Divya; Kumar, Yogesh; Kumar, Hemant; Kumar, Chandan; Jit, Satyabrata · IEEE Transactions on Nanotechnology · 2016
Ultraviolet Detection Properties of p-Si/n-TiO<sub>2</sub> Heterojunction Photodiodes Grown by Electron-Beam Evaporation and Sol-Gel Methods: A Comparative StudyRawat, Gopal; Somvanshi, Divya; Kumar, Hemant; Kumar, Yogesh; Kumar, Chandan; Jit, Satyabrata · IEEE Transactions on Nanotechnology · 2015
[IEEE 2015 Annual IEEE India Conference (INDICON) - New Delhi, India (2015.12.17-2015.12.20)] 2015 Annual IEEE India Conference (INDICON) - Structural and optical characteristics of n-TiO2 thin films by sol-gel methodRawat, Gopal; Kumar, Hemant; Kumar, Yogesh; Kumar, Chandan; Somvanshi, Divya; Jit, Satyabrata · 2015
Graphene Frequency MultipliersHan Wang, ; Nezich, D.; Jing Kong, ; Palacios, T. · IEEE Electron Device Letters · 2009
Impact ionization in GaAs MESFETsHui, K.; Hu, C.; George, P.; Ko, P.K. · IEEE Electron Device Letters · 1990
Stability Analysis in CNTFETsHaji-Nasiri, Saeed; Moravvej-Farshi, Mohammad Kazem · IEEE Electron Device Letters · 2013
A Memristor Device ModelYakopcic, Chris; Taha, Tarek M.; Subramanyam, Guru; Pino, Robinson E.; Rogers, Stanley · IEEE Electron Device Letters · 2011
Junctionless Tunnel Field Effect TransistorGhosh, Bahniman; Akram, Mohammad Waseem · IEEE Electron Device Letters · 2013
Strained SOI FINFET SRAM DesignKerber, Pranita; Kanj, Rouwaida; Joshi, Rajiv V. · IEEE Electron Device Letters · 2013
Electromigration characteristics of copper interconnectsTao, J.; Cheung, N.W.; Hu, C. · IEEE Electron Device Letters · 1993
MOSFET drain breakdown voltageWu-Shiung Feng, ; Chan, T.Y.; Chenming Hu · IEEE Electron Device Letters · 1986