[IEEE The 17th Annual Meeting of the IEEELasers and Electro-Optics Society, 2004. LEOS 2004. - Rio Grande, Puerto Rico (Nov. 8-9, 2004)] The 17th Annual Meeting of the IEEELasers and Electro-Optics Society, 2004. LEOS 2004. - An analyses of return loss in water immersion tests for PC connectorsKurokawa, H.; Hazama, R.; Kimura, Y.; Ikuno, S.; Mitachi, S. · 2004

[IEEE The 17th Annual Meeting of the IEEELasers and Electro-Optics Society, 2004. LEOS 2004. - Rio Grande, Puerto Rico (Nov. 8-9, 2004)] The 17th Annual Meeting of the IEEELasers and Electro-Optics Society, 2004. LEOS 2004. - Demonstration of an integrated, tunable high resolution true time delay lineLeGrange, J.; Kasper, A.; Madsen, C.; Cappuzzo, M.; Chen, E.; Griffin, A.; Laskowski, E.J.; Rasras, M. · 2004

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[IEEE The 17th Annual Meeting of the IEEELasers and Electro-Optics Society, 2004. LEOS 2004. - Rio Grande, Puerto Rico (Nov. 8-9, 2004)] The 17th Annual Meeting of the IEEELasers and Electro-Optics Society, 2004. LEOS 2004. - The design for an innovative semi-automatic die borderMatthews, K.; Cady, R.; Kelley, M.; Doig, A.; Sidebottom, N.; Knowles, P.; Sylvester, J.; Husted, A.; Albee, P.; Songsheng Tan, ; Hughes, L.; Thomas, J.; Booth, D.; Miller, B. · 2004

[IEEE The 17th Annual Meeting of the IEEELasers and Electro-Optics Society, 2004. LEOS 2004. - Rio Grande, Puerto Rico (Nov. 8-9, 2004)] The 17th Annual Meeting of the IEEELasers and Electro-Optics Society, 2004. LEOS 2004. - Comparison of noise redistribution in an SOA in pass-through and wavelength conversion modeOhman, F.; Tromborg, B.; Mark, J. · 2004

[IEEE The 17th Annual Meeting of the IEEELasers and Electro-Optics Society, 2004. LEOS 2004. - Rio Grande, Puerto Rico (Nov. 8-9, 2004)] The 17th Annual Meeting of the IEEELasers and Electro-Optics Society, 2004. LEOS 2004. - Fitting optical interconnects to an electrical world-packaging and reliability issues of arrayed optoelectronic modulesGoossen, K.W. · 2004

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All-epitaxial current- and mode-confined AlGaAs∕GaAs VCSELLu, D.; Ahn, J.; Deppe, D.G. · Electronics Letters · 2004

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