[IEEE 2017 IEEE 30th International Conference on Microelectronics (MIEL) - Nis (2017.10.9-2017.10.11)] 2017 IEEE 30th International Conference on Microelectronics (MIEL) - Capacitance model for MOSFET operated in all regions
- 作者Benfdila, A.; Lakhlef, A.
- 文件大小260.27KB
- 发表时间2017
- DOI10.1109/miel.2017.8190101
- 页码195-198
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