![Highlighting trapping phenomena in microwave GaN HEMTs by low-frequency S-parameters]()
Highlighting trapping phenomena in microwave GaN HEMTs by low-frequency S-parametersPotier, Clément; Jacquet, Jean-Claude; Dua, Christian; Martin, Audrey; Campovecchio, Michel; Oualli, Mourad; Jardel, Olivier; Piotrowicz, Stéphane; Laurent, Sylvain; Aubry, Raphaël; Patard, Olivier; Gamarra, Piero; di Forte-Poisson, Marie-Antoinette; Delage, Sylvain L.; Quéré, Raymond · International Journal of Microwave and Wireless Technologies · 2015