Exhibition: The EY Exhibition
- 期刊名称British Journal of General Practice
- 作者Jones, Roger
- 卷第68卷
- 期第671期
- 印刷ISSN0960-1643
- 电子ISSN1478-5242
- 文件大小1588.24KB
- 发表时间2018-06
- DOI10.3399/bjgp18X696473
- 页码286-286
Fault diagnosis in loop-connected systemsKewal K. Saluja; Brian D.O. Anderson · 1980
Testable design of large random access memoriesKewal K. Saluja; Kim Thang Le · 1984
On-chip testing of random access memoriesKewal K. Saluja · 1994
Sequential test generators: past, present and futureYong Chang Kim; Kewal K. Saluja · 1998
Incorporating testability considerations in high-level synthesisAshutosh Mujumdar; Rajiv Jain; Kewal Saluja · 1994
Vulnerability of Surveillance Networks to FaultsChin, Tai-Lin; Clouqueur, Thomas; Ramanathan, Parameswaran; Saluja, Kewal K. · International Journal of Distributed Sensor Networks · 2006
HYSIM: Hybrid Fault Simulation for Synchronous Sequential CircuitsKim, Kyuchull; Saluja, Kewal K. · VLSI Design · 1996
A Heuristic Measure to Maximize Detected Faults per TestKim T. Le; Kewal K. Saluja · 1998