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GaN Integration Technology, an Ideal Candidate for High-Temperature Applications: A Review

GaN Integration Technology, an Ideal Candidate for High-Temperature Applications: A Review

Hassan, Ahmad; Savaria, Yvon; Sawan, Mohamad

期刊名称IEEE Access
作者Hassan, Ahmad; Savaria, Yvon; Sawan, Mohamad
电子ISSN2169-3536
文件大小9968.02KB
发表时间2018
DOI10.1109/ACCESS.2018.2885285
页码1-1

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