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[IEEE 2018 19th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA (2018.3.13-2018.3.14)] 2018 19th International Symposium on Quality Electronic Design (ISQED) - Test set identification for improved delay defect coverage in the presence of statistical delays

[IEEE 2018 19th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA (2018.3.13-2018.3.14)] 2018 19th International Symposium on Quality Electronic Design (ISQED) - Test set identification for improved delay defect coverage in the presence of statistical delays

Javvaji, Pavan Kumar; Shanyour, Basim; Tragoudas, Spyros
  • 作者Javvaji, Pavan Kumar; Shanyour, Basim; Tragoudas, Spyros
  • 文件大小7.66KB
  • 发表时间2018
  • DOI10.1109/ISQED.2018.8357258
  • 页码14-19
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