海量图书期刊资源，随时随地畅享阅读乐趣
[IEEE 2019 Electron Devices Technology and Manufacturing Conference (EDTM) - Singapore, Singapore (2019.3.12-2019.3.15)] 2019 Electron Devices Technology and Manufacturing Conference (EDTM) - Modeling of Lateral Migration Mechanism During the Retention Operation in 3D NAND Flash MemoriesWoo, Changbeom; Kim, Shinkeun; Park, Jaeyeol; Lee, Dongiun; Kang, Myounggon; Jeon, Jongwook; Shin, Hyungcheol · 2019