![Microscopic Degradation Analysis of RF-Stressed AlGaN/GaN HEMTs]()
Microscopic Degradation Analysis of RF-Stressed AlGaN/GaN HEMTsGütle, Frank; Baeumler, Martina; Dammann, Michael; Cäsar, Markus; Walcher, Herbert; Waltereit, Patrick; Bronner, Wolfgang; Müller, Stefan; Kiefer, Rudolf; Quay, Rüdiger; Mikulla, Michael; Ambacher, Oliver; Graff, Andreas; Altmann, Frank; Simon, Michel · Materials Science Forum · 2012