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[IEEE Comput. Soc. Press International Test Conference 1990 - Washington, DC, USA (10-14 Sept. 1990)] Proceedings. International Test Conference 1990 - Current testingMaly, W. · 1990
[IEEE Comput. Soc. Press International Test Conference 1990 - Washington, DC, USA (10-14 Sept. 1990)] Proceedings. International Test Conference 1990 - Concurrent engineeringLowenstein, A.; Schlosser, S.; Winter, G. · 1990
[IEEE Comput. Soc. Press 1996 IEEE International Verilog HDL Conference - Santa Clara, CA, USA (26-28 Feb. 1996)] Proceedings. IEEE International Verilog HDL Conference - Hierarchical test coverageHerbert, A. · 1996
[IEEE Comput. Soc. Press International Test Conference 1990 - Washington, DC, USA (10-14 Sept. 1990)] Proceedings. International Test Conference 1990 - Errors in testingWilliams, R.H.; Hawkins, C.F. · 1990
[IEEE Comput. Soc. Press 1995 IEEE International Verilog HDL Conference - Santa Cruz, CA, USA (27-29 March 1995)] Proceedings. 1995 IEEE International Verilog HDL Conference - Incrementally recompiling VerilogChong Guan Tan, · 1995
[IEEE Comput. Soc. Press International Test Conference 1990 - Washington, DC, USA (10-14 Sept. 1990)] Proceedings. International Test Conference 1990 - enVision: the inside storyOrgan, D. · 1990
[IEEE Comput. Soc. Press 1995 IEEE International Verilog HDL Conference - Santa Cruz, CA, USA (27-29 March 1995)] Proceedings. 1995 IEEE International Verilog HDL Conference - Cycle simulation techniquesPalnitkar, S.; Parham, D. · 1995
[IEEE Comput. Soc. Press International Test Conference 1990 - Washington, DC, USA (10-14 Sept. 1990)] Proceedings. International Test Conference 1990 - Optimized testing of meshesMalek, M.; Ozden, B. · 1990