![[IEEE IEEE Compound Semiconductor Integrated Circuit Symposium. 2004 IEEE CISC Symposium - Monterey, CA, USA (24-27 Oct. 2004)] 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) - A high reliability GaN HEMT with SiN passivation by Cat-CVD]()
[IEEE IEEE Compound Semiconductor Integrated Circuit Symposium. 2004 IEEE CISC Symposium - Monterey, CA, USA (24-27 Oct. 2004)] 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) - A high reliability GaN HEMT with SiN passivation by Cat-CVDKunii, T.; Totsuka, M.; Kamo, Y.; Yamamoto, Y.; Takeuchi, H.; Shimada, Y.; Shiga, T.; Minami, H.; Kitano, T.; Miyakuni, S.; Nakatsuka, S.; Inoue, A.; Oku, T.; Nanjo, T.; Oishi, T.; Ishikawa, T.; Matsuda, Y. · 2004