New preparation of steroidal 3-hemisuccinates
- 期刊名称Collection of Czechoslovak Chemical Communications
- 作者Drašar, Pavel; Černý, Ivan; Pouzar, Vladimír; Havel, Miroslav
- 卷第49卷
- 期第1期
- 印刷ISSN0010-0765
- 电子ISSN1212-6950
- 文件大小553.99KB
- 发表时间1984
- DOI10.1135/cccc19840306
- 页码306-312
Reliability improvement of rapid thermal oxide using gas switchingMin Hung Lee, ; Cheng-Ya Yu, ; Fon Yuan, ; Chen, K.-F.; Chang-Chi Lai, ; Chee Wee Liu, · IEEE Transactions on Semiconductor Manufacturing · 2003
Room-Temperature Electroluminescence from Metal-Oxide-Silicon-Tunneling Diodes on (110) SubstratesLiu, Chee-Wee; Lee, Min-Hung; Chang, Shu-Tong; Chen, Miin-Jang; Lin, Ching-Fuh · Japanese Journal of Applied Physics · 2000
Improvement in electrical characteristics of HfO2 gate dielectrics treated by remote NH3 plasmaHuang, Li-Tien; Chang, Ming-Lun; Huang, Jhih-Jie; Lin, Hsin-Chih; Kuo, Chin-Lung; Lee, Min-Hung; Liu, Chee Wee; Chen, Miin-Jang · Applied Surface Science · 2013
The Roughness-Enhanced Light Emission from Metal-Oxide-Silicon Light-Emitting Diodes Using Very High Vacuum PrebakeLee, Min-Hung; Chen, Kuan-Fu; Lai, Chang-Chi; Liu, Chee Wee; Pai, Woei-Wu; Chen, Miin-Jang; Lin, Ching-Fuh · Japanese Journal of Applied Physics · 2002
Spin coating over topographyPeurrung, L.M.; Graves, D.B. · IEEE Transactions on Semiconductor Manufacturing · 1993
2014 VLSI Technology SymposuimIEEE Transactions on Semiconductor Manufacturing · 2014
Leading the field since 1884IEEE Transactions on Semiconductor Manufacturing · 2013
Supplier improvement via SPC applications workshopsAckermann, C.S. · IEEE Transactions on Semiconductor Manufacturing · 1993
Specular spectroscopic scatterometryXinhui Niu, ; Jakatdar, N.; Junwei Bao, ; Spanos, C.J. · IEEE Transactions on Semiconductor Manufacturing · 2001
A Continuous Murphy's IntegralNadarajah, S. · IEEE Transactions on Semiconductor Manufacturing · 2009
Defect size distribution in VLSI chipsGlang, R. · IEEE Transactions on Semiconductor Manufacturing · 1991
A new gas circulation RIEOhiwa, T.; Sakai, I.; Okumura, K. · IEEE Transactions on Semiconductor Manufacturing · 2000