Enhancing science and mathematics teachingKenneth Tobin; Nancy Davis; Kenneth Shaw; Elizabeth Jakubowski · 1991

SPIE Proceedings [SPIE Electronic Imaging '99 - San Jose, CA (Saturday 23 January 1999)] Machine Vision Applications in Industrial Inspection VII - <title>Image retrieval in the industrial environment</title>Tobin, Jr., Kenneth W.; Karnowski, Thomas P.; Ferrell, Regina K.; Tobin, Jr., Kenneth W.; Chang, Ning S. · 1999

SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Machine Vision Applications in Industrial Inspection VIII - <title>Content-based image retrieval for semiconductor manufacturing</title>Karnowski, Thomas P.; Tobin, Jr., Kenneth W.; Ferrell, Regina K.; Lakhani, Fred; Tobin, Jr., Kenneth W. · 2000

SPIE Proceedings [SPIE Quality Control by Artificial Vision - Gatlinburg, United States (Monday 19 May 2003)] Sixth International Conference on Quality Control by Artificial Vision - Patterned wafer segmentationBourgeat, Pierrick T.; Tobin, Jr., Kenneth W.; Meriaudeau, Fabrice; Meriaudeau, Fabrice; Tobin, Jr., Kenneth W.; Gorria, Patrick · 2003

Urban science educationAngela Calabrese Barton; Kenneth Tobin · 2001

PrefaceAngela Calabrese Barton; Kenneth G. Tobin; James J. Gallagher · 2001

PrefaceJames J. Gallagher; Kenneth G. Tobin; Angela Calabrese Barton · 2001

Student task involvement in activity oriented scienceKenneth Tobin · 1984