海量图书期刊资源,随时随地畅享阅读乐趣
Study on depth profiles of hydrogen in the surface region of metal by ERDALiao Changgeng; Wang Yongqiang; Yang Shengsheng; Jiang Hui; Zheng Zhihao · 1995
Study on the hydrogen depth profiles in amorphous silicon films by elastic recoil detectionLiao Changgeng; Wang Yongqiang; Yang Shengsheng; Jiang Hui; Zheng Zhihao · 1993
Study of boron depth profiles in IPI amorphous silicon films after thermal annealing using the (p, α) reactionChanggeng Liao; Zhihao Zheng; Yongqiang Wang; Shengsheng Yang; Hui Jiang · 1991