海量图书期刊资源,随时随地畅享阅读乐趣
Backscatter Electron Imaging and Electron Backscatter Diffraction Characterization of LaCoO3 During In Situ CompressionMorten Karlsen; Mari-Ann Einarsrud; Hilde L. Lein; Tor Grande; J. Hjelen; Per Erik Vullum · 2009
Electron Backscatter Diffraction Characterization of Nanostructured Thermoelectric MaterialsNowell, M.; Beck, J.; Alvarado, M.; Nemir, D. · Microscopy and Microanalysis · 2012
Subgrain Structures Characterized by Electron Backscatter Diffraction (EBSD)Bunkholt, Sindre; Marthinsen, Knut; Nes, Erik · Materials Science Forum · 2014
Electron backscatter diffraction as a useful method for alloys microstructure characterizationLeszek Klimek; Bożena Pietrzyk · 2004
Advanced Characterization of Twins Using Automated Electron Backscatter DiffractionWright, Stuart I.; Bingert, John; Mason, Thomas A.; Larsen, Ryan J. · Materials Science Forum · 2002
Electron backscatter diffraction characterization of inlaid cu lines for interconnect applicationsD. P. Field; T. Muppidi; J. E. Sanchez Jr. · 2003
Nanostructural Characterization of CdTe Thin Film Photovoltaics Using Electron Backscatter DiffractionNowell, MM; Carpenter, JO; Wright, SI · Microscopy and Microanalysis · 2010
Electron Backscatter Diffraction (EBSD) Characterization of Uranium and Uranium AlloysMcCabe, R.J.; Kelly, A.M.; Clarke, A.J.; Wenk, R. · Microscopy and Microanalysis · 2012
Preface to NanoSEA 2012Berbezier, Isabelle; De Crescenzi, Maurizio · Thin Solid Films · 2013
Nanostructured plasma polymersKylián, O.; Choukourov, A.; Biederman, H. · Thin Solid Films · 2013
PrefaceThin Solid Films · 2013
PrefaceOnoda, Mitsuyoshi; Iwamoto, Mitsumasa; Otomo, Akira · Thin Solid Films · 2014
PrefaceThin Solid Films · 2014
Spectroscopic ellipsometry — Past, present, and futureAspnes, D.E. · Thin Solid Films · 2014
PrefaceSzuber, Jacek · Thin Solid Films · 2013
Useful Mueller matrix symmetries for ellipsometryArteaga, Oriol · Thin Solid Films · 2014