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[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Surprises in sequential redundancy identification

[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Surprises in sequential redundancy identification

Iyer, M.A.; Long, D.E.; Abramovici, M.

作者Iyer, M.A.; Long, D.E.; Abramovici, M.
文件大小716.26KB
发表时间1996
DOI10.1109/edtc.1996.494131
页码88-94

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