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[IEEE 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) - Bremen (2016.9.19-2016.9.23)] 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - A fault-tolerant implementation of the median filterAranda, Luis Alberto; Reviriego, Pedro; Maestro, Juan Antonio · 2016
[IEEE 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) - Bremen (2016.9.19-2016.9.23)] 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Generating SEL and SEU with a class 1 laser setupZollner, Hannes; Hupka, Marcus; Preuser, Henry; Vos, Burkart · 2016
[IEEE 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) - Bremen (2016.9.19-2016.9.23)] 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - A 6 MeV electron linac facility for multipurpose radiation testingAubert, D.; Assaillit, G.; Auriel, G.; Delbos, C.; Garrigues, A.; de Gaufridy, F.; Labarbe, L.; Plouhinec, D.; Queiros, A.; Ribeiro, P.; Ribiere, M.; Ritter, S.; Rizzon, A. · 2016
[IEEE 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) - Bremen (2016.9.19-2016.9.23)] 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Charge transfer inefficiency mitigation in a CCD by trap pumpingGow, J. P. D.; Murray, N. J. · 2016
[IEEE 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) - Bremen (2016.9.19-2016.9.23)] 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - A preliminary study of SEE soft error propagation based on cellular automatonWei, He; Yueke, Wang; Kefei, Xing · 2016
[IEEE 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Bremen, Germany (2016.9.19-2016.9.23)] 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - A complete qualification of floating gate dosimeter for CERN applicationsBrucoli, M.; Danzeca, S.; Brugger, M.; Masi, A.; Pineda, A.; Cesari, J.; Dusseau, L. · 2016
[IEEE 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) - Bremen (2016.9.19-2016.9.23)] 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Ionizing radiation effects on a COTS low-cost RISC microcontrollerLeite, Felipe G. H.; Santos, Roberto B. B.; Araujo, Nicolas E.; Cirne, Karlheiz H.; Medina, Nilberto H.; Aguiar, Vitor. A. P.; Giacomini, Renato C.; Added, Nemitala; Aguirre, Fernando; Macchione, Eduardo L. A.; Vargas, Fabian; da Silveira, Marcilei A. G. · 2016
[IEEE 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) - Bremen (2016.9.19-2016.9.23)] 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Total ionizing dose sensitivity of a radiation-tolerant phase-locked loop in a 130 nm SOI technologyChen, Zhuojun; Lin, Min; Ding, Ding; Zheng, Yunlong; Sang, Zehua; Zou, Shichang; Chen, Rongmei · 2016
Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs From MCUsClemente, Juan Antonio; Franco, Francisco J.; Villa, Francesca; Baylac, Maud; Rey, Solenne; Mecha, Hortensia; Agapito, Juan A.; Puchner, Helmut; Hubert, Guillaume; Velazco, Raoul · IEEE Transactions on Nuclear Science · 2016
Statistical Deviations from the Theoretical only-SBU Model to Estimate MCU rates in SRAMsFranco, Francisco J.; Clemente, Juan Antonio; Baylac, Maud; Rey, Solenne; Villa, Francesca; Mecha, Hortensia; Agapito, Juan A.; Puchner, Helmut; Hubert, Guillaume; Velazco, Raoul · IEEE Transactions on Nuclear Science · 2017
[IEEE 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Moscow, Russia (2015.9.14-2015.9.18)] 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Statistical Anomalies of Bitflips in SRAMs to Discriminate MCUs from SEUsClemente, Juan Antonio; Franco, Francisco J.; Villa, Francesca; Baylac, Maud; Rey, Solenne; Mecha, Hortensia; Agapito, Juan A.; Puchner, Helmut; Hubert, Guillaume; Velazco, Raoul · 2015