Using ToF-SIMS to study industrial surface phenomenaSmentkowski, Vincent S.; Keenan, Michael R.; Arlinghaus, Henrik · Surface Science · 2016

Laser Activation Modification of Semiconductor Surfaces (LAMSS)Zhang, Feng; Pei, Lei; Bennion, Eliot; Jiang, Guilin; Connley, David; Yang, Li; Lee, Michael V.; Davis, Robert C.; Smentkowski, Vincent S.; Strossman, Greg; Linford, Matthew R.; Asplund, Matthew C. · Langmuir · 2006

Analysis of Thin Phase-Shifter Films using Surface Analysis TechniquesSmentkowski, Vincent S.; LeTarte, Laurie; Piao, Hong; Marko, Michael · Microscopy and Microanalysis · 2016

Chemomechanical Nanolithography: Nanografting on Silicon and Factors Impacting LinewidthLee, Michael V.; Hoffman, Melinda Tonks; Barnett, Katherine; Geiss, John-Mark; Smentkowski, Vincent S.; Linford, Matthew R.; Davis, Robert C. · Journal of Nanoscience and Nanotechnology · 2006

Characterization of Surface and Sub- Surface Defects on Devices using Complimentary TechniquesSmentkowski, Vincent S.; Ostrowski, Sara G.; Denault, Lauraine; Woychik, Charles G. · Microscopy Today · 2008

Time of flight secondary ion mass spectrometry: A powerful high throughput screening toolSmentkowski, Vincent S.; Ostrowski, Sara G. · Review of Scientific Instruments · 2007

Atomic-Scale Phase Composition through Multivariate Statistical Analysis of Atom Probe Tomography DataKeenan, Michael R.; Smentkowski, Vincent S.; Ulfig, Robert M.; Oltman, Edward; Larson, David J.; Kelly, Thomas F. · Microscopy and Microanalysis · 2011