Low frequency noise characterization of 0.18μm Si CMOS transistors
- 作者T. Boutchacha; G. Ghibaudo; G. Guégan; T. Skotnicki
- 卷第37卷
- 印刷ISSN0026-2714
- 文件大小253.42KB
- 发表时间1997
- DOI10.1016/s0026-2714(97)00119-4
- 页码1599-1602
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