Characterisation of degradation mechanisms in resonant tunnelling diodes
- 作者A. Vogt; M. Brandt; A. Sigurdardottir; M. Schüssler; D. Peña; A. Simon; H.L. Hartnagel; M. Rodewald; M. Roesner; H. Fuess; S.N.N. Goswami; K. Lal
- 卷第37卷
- 印刷ISSN0026-2714
- 文件大小308.95KB
- 发表时间1997
- DOI10.1016/s0026-2714(97)00141-8
- 页码1691-1694
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