[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - An active cold plate for power electronics
- 作者Roy, S.K.; Avanic, B.L.
- 文件大小294.21KB
- 发表时间2003
- DOI10.1109/stherm.2003.1194367
- 页码231-235
[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2003.03.13-2003.03.13)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.03CH37437)2003
[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - Recent progress in compact thermal modelsLasance, C.J.M. · 2003
[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - 2003 cumulative bibliography of articles on semiconductor thermal measurement, management and modelingSiegal, B.S. · 2003
[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - Thermal management of portable micro fuel cell stacksHahn, R.; Krumm, M.; Reichl, H. · 2003
[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - Reliability prediction for TFBGA assembliesRadivojevic, Z.; Abdul-Quadir, Y.; Myllykoski, P.; Rantala, J. · 2003
[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - Through the substrate, backside thermal measurements on active semiconductor devices using near IR thermoreflectanceChristofferson, J.; Shakouri, A. · 2003
[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - Lumped capacity thermal circuit diagram of active chip cooling schemesSabounchi, P.; Heydari, A. · 2003