An Introduction to Nuclear Waste Immobilisation || Nuclear Waste Regulations
- 作者Ojovan, M.I.
- 文件大小156.51KB
- 发表时间2005
- DOI10.1016/b978-008044462-8/50009-0
- 页码61-69
Surface photovoltage measured capacitance: Application to semiconductor/electrolyte systemKamieniecki, Emil · Journal of Applied Physics · 1983
Defect specific photoconductance: Carrier recombination through surface and other extended crystal imperfectionsKamieniecki, Emil · Journal of Applied Physics · 2012
Effect of defect clusters on carrier recombination in high-resistivity CdZnTeKamieniecki, Emil · Journal of Applied Physics · 2013
Surface Charge Evolution during Early Stage of Thermal Oxidation of SiliconWang, Jianbai; Roman, Paul; Kamieniecki, Emil; Ruzyllo, Jerzy · Electrochemical and Solid-State Letters · 2003
Effect of charge trapping on effective carrier lifetime in compound semiconductors: High resistivity CdZnTeKamieniecki, Emil · Journal of Applied Physics · 2014
Recombination of carriers at n-Si/SiO2 interface via mobile centers in the oxideKamieniecki, Emil · Journal of Applied Physics · 1985
Electrochemical characterization of p-type semiconducting tungsten disulfide photocathodes: efficient photoreduction processes at semiconductor/liquid electrolyte interfacesBaglio, Joseph A.; Calabrese, Gary S.; Harrison, D. Jed; Kamieniecki, Emil; Ricco, Antonio J.; Wrighton, Mark S.; Zoski, Glenn D. · Journal of the American Chemical Society · 1983