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[IEEE 2009 14th IEEE European Test Symposium - Sevilla, Spain (2009.05.25-2009.05.29)] 2009 14th IEEE European Test Symposium - Title Page iii2009
[IEEE 2009 14th IEEE European Test Symposium - Sevilla, Spain (2009.05.25-2009.05.29)] 2009 14th IEEE European Test Symposium - Title Page i2009
Guest EditorialChristian Landrault · 2000
Guest EditorialChristian Landrault · 1999
Guest EditorialChristian Landrault · 2002
Guest EditorialChristian Landrault · 2003
Fault modeling and fault equivalence in CMOS technologyMarie -Lise Flottes; Christian Landrault; Serge Pravossoudovitch · 1991
A Gated Clock Scheme for Low Power Testing of Logic CoresYannick Bonhomme; Patrick Girard; Loïs Guiller; Christian Landrault; Serge Pravossoudovitch; Arnaud Virazel · 2006
Parametric Analysis of 2-Unit Redundant Computer Systems With Corrective and Preventive MaintenanceLaprie, Jean-Claude; Costes, Alain; Landrault, Christian · 1981
Testability improvements using E-Beam controllability: Principle and design for Electron-Beam testabilityChristian Landrault; Pascal Nouet · 1996