Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions
- 作者Takayuki Hisaka; Hajime Sasaki; Yoichi Nogami; Kenji Hosogi; Naohito Yoshida; A.A. Villanueva; Jesus A. del Alamo; Shigehiko Hasegawa; Hajime Asahi
- 卷第49卷
- 期第12期
- 印刷ISSN0026-2714
- 文件大小489.23KB
- 发表时间2009
- DOI10.1016/j.microrel.2009.07.046
- 页码1515-1519
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